Imaging Beam‐Sensitive Materials by Electron Microscopy
نویسندگان
چکیده
منابع مشابه
Examination of Lung Parenchyma by Electron Microscopy
In this paper many of the principal structure of the Moral Lung were studied with the help of Electron Microscopy. Detailed description was given of Granular Pneumocytes, Membranous Pneumocytes, Macrophages, and Alveolar Capillaries. A discussion followed on the form and function of Granular Pneumocytes. Acknowledgements I am grateful to the Reza Shah Pahlavi Foundation for its generou...
متن کاملIsolation of Herpetosiphon giganteus and Ultrastructure Analysis by Electron Microscopy
Herpetosiphon giganteus is a filamentous gliding bacterium. Gliding motility is the movement of the cells over surfaces without the aid of flagella. The mechanism responsible for bacterial gliding motility has not been known and there are only a few data on Herpetosiphon giganteus. The aim of this study was to observe the ultrastructure and negative staining of isolated strains of Herpetosiphon...
متن کاملPhoto Electron Emission Microscopy of Polarity-patterned Materials Photo Electron Emission Microscopy of Polarity-patterned Materials
This study presents variable photon energy photo electron emission microscopy (PEEM) of polarity-patterned epitaxial GaN films, and ferroelectric LiNbO3 (LNO) single crystals and PbZrTiO3 (PZT) thin films. The photo electrons were excited with spontaneous emission from the tunable UV free electron laser (FEL) at Duke University. We report PEEM observation of polarity contrast and measurement of...
متن کاملEvaluation of Devices and Materials by Transmission Electron Microscopy
With the components of cutting-edge devices becoming smaller and more complicated and their constituent materials becoming more multilayered and diversified, nanometer-order structural control has recently become indispensable. To improve the performance and reliability of manufactured products like these devices, nanometer-order evaluation technology is therefore essential. As examples, this p...
متن کاملMaterials characterisation by angle-resolved scanning transmission electron microscopy
Solid-state properties such as strain or chemical composition often leave characteristic fingerprints in the angular dependence of electron scattering. Scanning transmission electron microscopy (STEM) is dedicated to probe scattered intensity with atomic resolution, but it drastically lacks angular resolution. Here we report both a setup to exploit the explicit angular dependence of scattered i...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Advanced Materials
سال: 2020
ISSN: 0935-9648,1521-4095
DOI: 10.1002/adma.201907619